Published June 1977 | Version v1
Journal article

Computer simulation of tungsten field evaporation by field-ion microscope

  • 1. Institute of Theoretical and Experimental Physics, 117259 Moscow, USSR

Description

An idea of the use of the computer simulation of the field evaporation process in the field-ion microscope for the interpretation of the experimental data of this process is developed. The computer program is suggested and the results of a quantitative analysis of the process in the continuous regime (electric field intensity F is constant) are given for tungsten. (Auth.)

Additional details

Identifiers

Publishing Information

Journal Title
Surface Science
Journal Volume
65
Journal Issue
1
Series
Surf. Sci.
Journal Page Range
354-360
ISSN
0039-6028

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
8341655
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMS; COMPUTER CALCULATIONS; ELECTRIC FIELDS; EVAPORATION; ION MICROSCOPY; SIMULATION; TUNGSTEN
Descriptors DEC
ELEMENTS; METALS; MICROSCOPY; PHASE TRANSFORMATIONS; TRANSITION ELEMENTS

Optional Information

Notes
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