Tuning size and coverage of Pd nanoparticles using atomic layer deposition
Creators
- 1. Department of Solid State Sciences, COCOON Group, Ghent University, Krijgslaan 281, B-9000 Ghent (Belgium)
- 2. ALBA Synchrotron Light Source, SWEET-NCD Beamline, Carrer de la Llum 2-26, 08290 Cerdanyola del Vallès (Spain)
Description
Highlights: • Synchrotron-based in situ GISAXS and XRF are applied during Pd plasma-enhanced ALD. • The nucleation and the evolution in Pd nanoparticle morphology is investigated. • Pre-pulses with trimethylaluminum enhance the initial coverage of Pd nanoparticles. • The role of extra O2 plasma pulse, with H2 plasma as co-reactant, is investigated. • Precise control of the Pd nanoparticle dimensions and coverage is achieved. The morphology evolution of supported palladium nanoparticles (Pd NPs) during plasma-enhanced atomic layer deposition using palladium hexafluoroacetylacetonate (Pd(hfac)2) as precursor was investigated using in situ and ex situ X-ray fluorescence (XRF) and grazing incidence small angle X-ray scattering (GISAXS), as well as ex situ scanning electron microscopy (SEM). The initial areal density of Pd NPs increases through adding cycles of the three-step process using Pd(hfac)2, H2 plasma and trimethylaluminum (TMA) prior to the standard Pd(hfac)2 + H2 plasma process. The participation of an O2 plasma exposure as additional co-reactant before or after the H2 plasma step also plays a role in the nucleation density and particle coalescence, affecting also the shape of the deposited particles. Based on the gathered knowledge, a synthetic approach that enables precise control of the Pd nanoparticle dimensions and coverage is developed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2020.148238Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2020.148238;
- PII
- S0169433220329950;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 539
- Journal Page Range
- vp.
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54078036
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DEPOSITION; DEPOSITS; FLUORINE COMPOUNDS; HYDROGEN; LAYERS; NANOPARTICLES; PLASMA; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; X RADIATION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; HALOGEN COMPOUNDS; IONIZING RADIATIONS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; PARTICLES; RADIATIONS; SCATTERING; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.