Published August 1, 2012 | Version v1
Journal article

Structural characterizations of sol-gel synthesized TiO2 and Ce/TiO2 nanostructures

  • 1. Department of Chemistry, Faculty of Science, Kasetsart University, Bangkok 10903 (Thailand)
  • 2. Faculty of Resources and Environment, Kasetsart University Si Racha Campus, Chonburi 20230 (Thailand)
  • 3. Thailand Center of Excellence in Physics (ThEP Center), Commission on Higher Education, Bangkok 10400 (Thailand)
  • 4. Department of Physics, Faculty of Science, Kasetsart University, Bangkok 10903 (Thailand)
  • 5. Synchrotron Light Research Institute, Nakhon Ratchasima 30000 (Thailand)
  • 6. School of Physics, Suranaree University of Technology, Nakhon Ratchasima 30000 (Thailand)
  • 7. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

Description

Mixed phase TiO2 and Ce/TiO2 samples were synthesized by a sol-gel method using different hydrolysis conditions. In pure TiO2 samples, traditional X-ray diffraction (XRD) and Ti K-edge synchrotron X-ray absorption near edge structures (XANES) independently revealed their anatase/rutile phase ratios. XANES results further revealed a substantial amount of Ti atoms existed in other forms beside anatase and rutile TiO2 in the sample synthesized by the low hydrolysis condition. An increase in the extent of the hydrolysis during the synthesis leads to an increased rutile ratio and a reduction in other forms. In Ce/TiO2 samples, the crystal sizes were too small for XRD characterization. Only XANES could be used to characterize their phase ratios. It is found that adding Ce impedes rutile formation; leading to increased anatase ratio. The difference in the fundamental aspects of XRD and XANES techniques in providing the phase ratios is discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2011.08.108

Additional details

Identifiers

DOI
10.1016/j.physb.2011.08.108;
PII
S0921-4526(11)00922-7;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
407
Journal Issue
15
Journal Page Range
p. 2915-2918
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
26. international conference on defects in semiconductors
Dates
18-22 Jul 2011
Place
Nelson (New Zealand)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.