Published March 1, 2006 | Version v1
Journal article

Growth and characterization of chemical-vapor-deposited zinc oxide nanorods

  • 1. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 300, Taiwan (China)

Description

ZnO nanorods were grown on Si substrates by metal-organic chemical vapor deposition (CVD). The ZnO nanorods were characterized by scanning electron microscopy, transmission electron microscopy (TEM), and X-ray diffraction. It was found that highly oriented ZnO single-crystalline nanorods were formed only on the substrate coated with a gold film. Without the gold, ZnO was deposited as a continuous film. No Au was observed on top of the ZnO nanorods, implying that the Au plays no role as catalytic metal in vapor-liquid-solid mechanism for formation of ZnO nanorods. In CVD, oriented ZnO nanorods along the c-axis were grown as a result of <111> textured Au. High-resolution TEM shows that the gold layer and ZnO are in orientation relationship of Au {111} planes//ZnO (0002) basal planes

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.07.096;
PII
S0040-6090(05)00958-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
498
Journal Issue
1-2
Journal Page Range
p. 137-141
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
3. Asian conference on chemical vapor deposition
Dates
12-14 Nov 2004
Place
Taipei, Taiwan (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37112398
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHEMICAL VAPOR DEPOSITION; FILMS; GOLD; LAYERS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SURFACE COATING; TRANSITION ELEMENTS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.