Published December 1975
| Version v1
Journal article
Dosimetry of gamma-irradiated semiconductor devices
Description
Extensive use is made of 60Co gamma radiation for the investigation of radiation effects in semiconductor devices. A survey of the literature, however, reveals widespread inconsistencies and loose usage in the units of dosimetry. This note points out that rigorous definitions of the concepts ''absorbed dose'' and ''exposure,'' and their units, have been established by the International Commission on Radiation Units and Measurements (ICRU), and suggests greater consistency by workers in the field of radiation effects in electronic devices and materials
Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 22
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 2703-2703
- ISSN
- 0018-9499
Conference
- Title
- Annual conference on nuclear and space radiation effects.
- Dates
- 14 Jul 1975.
- Place
- Arcata, CA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7252598
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- GAMMA DOSIMETRY; GAMMA RADIATION; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES
- Descriptors DEC
- DOSIMETRY; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION EFFECTS; RADIATIONS
Optional Information
- Notes
- Published in Summary Form Only.; Updated automatically by Metadata and Full-Text Enrichment Agent