Published December 1975 | Version v1
Journal article

Dosimetry of gamma-irradiated semiconductor devices

Creators

  • 1. Communications Research Center, Ottawa

Description

Extensive use is made of 60Co gamma radiation for the investigation of radiation effects in semiconductor devices. A survey of the literature, however, reveals widespread inconsistencies and loose usage in the units of dosimetry. This note points out that rigorous definitions of the concepts ''absorbed dose'' and ''exposure,'' and their units, have been established by the International Commission on Radiation Units and Measurements (ICRU), and suggests greater consistency by workers in the field of radiation effects in electronic devices and materials

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
22
Journal Issue
6
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
2703-2703
ISSN
0018-9499

Conference

Title
Annual conference on nuclear and space radiation effects.
Dates
14 Jul 1975.
Place
Arcata, CA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7252598
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
GAMMA DOSIMETRY; GAMMA RADIATION; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES
Descriptors DEC
DOSIMETRY; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION EFFECTS; RADIATIONS

Optional Information

Notes
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