Published September 2019 | Version v1
Journal article

Effect of temperature dependent electronics surface and grainboundary scattering on resistivity of polycrystalline silver nanowire fabricated by two-beam laser fabrication technique

  • 1. Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, CAS, Beijing 100029, PR (China)
  • 2. Laboratory of Organic NanoPhotonics, Technical Institute of Physics and Chemistry, CAS, Beijing 100190, PR (China)

Description

A polycrystalline AgNW is fabricated by the two-beam laser fabrication technique on the polyethylene terephthalate substrate to investigate the temperature dependent surface and grainboundary scattering effect on its electrical properties. The AgNW is typical of the good metal due to that the temperature dependent resistance is well fitted with the Bloch-Grüneisen formula. Because of the phonon soften by the AgNW surface and internal twin boundaries scattering, the Debye temperature of the AgNW (223 K) is lower than that of the bulk silver (235 K), while the electron-phonon coupling constant of the AgNW (1.19 × 10−7 Ω·m) is higher than that of the bulk (5.24 × 10−8 Ω·m). For the surface and grainboundary scattering of electron in AgNW, the residue resistivity (1.49 × 10−7 Ω·m) is much higher than that of bulk (10−10 Ω·m). The surface scattering contribution to the resistivity is independent with the temperature. But the grainboundary scattering contribution to that is increased with temperature increasing. By comparing the measured resistivity with the calculated results according Fuchs-Sondheimer theory and the Mayadas-Shatzkes theory, the grainboundary reflection coefficient of the AgNW is increased from 5.0722 to 5.4220 with the temperature increasing from 20 to 300 K.

Additional details

Identifiers

DOI
10.1016/j.apsusc.2019.05.225;
PII
S0169433219315338;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
488
Journal Page Range
p. 46-50
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.