Atomic layer deposition: basic principles and preparation of thin films for energy applications
Creators
- 1. Institute of Electrical Engineering, SAS, 841 04 Bratislava and Centre for Advanced Materials Application, SAS, 845 11 Bratislava (Slovakia)
Description
Atomic layer deposition (ALD) is chemical method based on a sequential introduction of chemical precursors and reactants. Compared to chemical vapour deposition distinctive and clear feature of ALD lies in the self-limiting nature of precursor adsorption and reaction. ALD growth consists of the four steps: 1) precursor adsorption, 2) purging, 3) reactant exposure and 4) purging. These steps constitute an ALD cycle. ALD takes place in conditions where precursor adsorption is the self-limiting step, i.e. only 1 molecular layer is adsorbed at the surface. Theoretically, exposure to reactant gives rise to formation of 1 atomic layer of the reaction product. Consequently, ALD is a surface-controlled process, where parameters other than reactants, substrate and temperature have little influence. ALD application in microelectronics as well as ALD films for energy application are discussed. (authors)
Additional details
Identifiers
Publishing Information
- Publisher
- Pavol Jozef Safarik University in Kosice, SafarikPress
- Imprint Place
- Kosice (Slovakia)
- ISBN
- 978-80-8152-941-2
- Imprint Title
- The 4. International Conference on Nanomaterials: Fundamentals and Applications. Book of Abstracts
- Imprint Pagination
- 91 p.
- Journal Page Range
- p. 60-62
- Report number
- INIS-SK--2024-002
Conference
- Title
- Nanomaterials 2020
- Dates
- 10-11 Nov 2020
- Place
- Kosice (Slovakia)
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 55031559
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; ELECTRIC CONDUCTIVITY; EXPERIMENTAL DATA; LAYERS; NANOSTRUCTURES; PHYSICAL VAPOR DEPOSITION; THICKNESS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DATA; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTRICAL PROPERTIES; FILMS; INFORMATION; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SURFACE COATING
Optional Information
- Contract/Grant/Project number
- Projects ERDF ITMS 313021T081; VEGA 2/0136/18
- Notes
- 4 figs., 10 refs.; Online conference; Also published on the web 4.6 MBytes in PDF format; Reviewed by: Renata Orinakova and Strakova Fedorkova, A.