ATLAS irradiation studies of n-in-n and p-in-n silicon microstrip detectors
Description
Prior to the module production of the ATLAS silicon microstrip tracker for the barrel and the forward wheels, the characterisation of full-size prototype silicon detectors after radiation to fluences corresponding to 10 years of ATLAS operation is required. The behaviour of p-in-n and n-in-n detectors produced by several manufacturers before and after irradiation to a fluence of 3x1014 protons/cm2 at the CERN PS facility is discussed. This article summarises some recent results from the ATLAS SCT collaboration. The measurements of leakage current, full depletion voltage, signal-to-noise ratio and charge collection efficiency are presented. Despite the better efficiency performance of n-in-n detectors below depletion, the collaboration chose the p-in-n technology due to its simpler and less costly production since good charge collection efficiencies were achieved at the desired maximum bias voltage. (author)
Additional details
Identifiers
- PII
- S0168900299004131;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 435
- Journal Issue
- 1-2
- Journal Page Range
- p. 74-79
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- India
- INIS RN
- 34042958
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANNEALING; ATLAS SUPERCONDUCTING LINAC; CERN PS SYNCHROTRON; CHARGE COLLECTION; EFFICIENCY; ELECTRIC POTENTIAL; IRRADIATION; LEAKAGE CURRENT; PROTONS; RADIATION EFFECTS; SIGNAL-TO-NOISE RATIO; SILICON; SPECIFICATIONS
- Descriptors DEC
- ACCELERATORS; BARYONS; CURRENTS; CYCLIC ACCELERATORS; ELECTRIC CURRENTS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; HEAT TREATMENTS; HEAVY ION ACCELERATORS; HILACS; LINEAR ACCELERATORS; NUCLEONS; SEMIMETALS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.