Published May 2001
| Version v1
Journal article
Crystallographic texture evolution of hexagonal CoCrMn thin films depending on the Mn content and processing parameters
Creators
Description
Texture of CoCrMn alloy thin films with varing Mn content was investigated by X-ray diffraction. HCP (Co64Cr36)100-xMnx (5<x<12) thin films showed the spontaneous in-plane texture when grown on a heated glass substrate. Strong (1 0 1 =macron 0) texture of CoCrMn thin films appeared only with proper Mn addition while Co64Cr36 thin film showed random orientation
Additional details
Identifiers
- PII
- S0304885300013767;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 226-230
- Journal Issue
- 1-3
- Journal Page Range
- p. 1666-1668
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33044550
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM COMPOUNDS; COBALT COMPOUNDS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; GLASS; HCP LATTICES; INTERMETALLIC COMPOUNDS; MANGANESE ADDITIONS; MANGANESE COMPOUNDS; RANDOMNESS; SPUTTERING; SUBSTRATES; TERNARY ALLOY SYSTEMS; TEXTURE; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; FILMS; HEXAGONAL LATTICES; MANGANESE ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.