Electrical properties of thin ytterbium films

Results are reported on the in-situ electrical resistivity and temperature coefficient of resistance (TCR) of thin ytterbium films in the thickness range of 10 to 80 nm. The TCR measurements were made in the temperature range of 295 K to 448 K. The experimental results are compared with theoretical data and are in good agreement at higher thickness films (> 40 nm). The variation of the sheet resistance with temperature (heating and cooling) has been shown in the thickness range of 20 to 60 nm