Published February 25, 2009 | Version v1
Journal article

On the activation of recrystallization nucleation sites in Cu and Fe

  • 1. Department of Materials Science and Engineering, McMaster University, 1280 Main Street, Hamilton, L8S 4L7 (Canada)
  • 2. SIMAP, Institut National Polytechnique de Grenoble, St. Martin d'Heres 38404 (France)

Description

Rapid thermal heat treatments were used to investigate the early stages of recrystallization in pure iron and copper. The nucleation events for the recrystallization process were observed to take place in the vicinity of triple junctions, grain boundaries and grain interiors. Electron Back-scatter Diffraction (EBSD) was used to measure both the frequency of nucleation events and the misorientation gradients present at each of the above sites. The potency of the nucleation sites was found to increase with the local misorientation gradient. A simple physically based model was developed to predict the incubation time for the formation of recrystallization embryos in the vicinity of each site. This model can be coupled to existing recrystallization and growth models to produce a more complete description of the recrystallization processes including the competition between nucleation sites

Availability note (English)

Available from http://dx.doi.org/10.1016/j.msea.2008.10.015

Additional details

Identifiers

DOI
10.1016/j.msea.2008.10.015;
PII
S0921-5093(08)01170-2;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
502
Journal Issue
1-2
Journal Page Range
p. 70-78
ISSN
0921-5093
CODEN
MSAPE3

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40068762
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BACKSCATTERING; COPPER; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; HEAT TREATMENTS; IRON; NUCLEATION; RECRYSTALLIZATION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; METALS; MICROSTRUCTURE; SCATTERING; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.