Deposition and sputtering yields on EUV collector mirror from Laser Plasma Extreme Ultraviolet Sources
Creators
- 1. Wuhan National Laboratory for Optoelectronics, School of Optoelectronic Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074 (China)
- 2. Depart of Computer Science, Jiangxi University of Traditional Chinese Medicine, Nanchang 330004, Jiangxi (China)
- 3. School of Physics and Electric Information, Hubei University of Education 1 Nanhuan Road, Wuhan East High-Tech. Zone, Wuhan 430205, Hubei (China)
Description
Based on the self-similar solution of gas dynamic equations, spherical expansion of the highly ionized plasma with limited mass into a vacuum is investigated for the droplet target laser-produced plasma extreme ultraviolet (LPP-EUV) sources. Using partially numerical and partially analytical technology, the velocity, the temperature and the density profiles in the plume versus ionization degree, adiabatic index and initial conditions are presented. Furthermore, the spatial thickness variations of the deposited substrate witness and ion sputtering yields for Ru, Mo, and Si under Sn ion bombardment are theoretically calculated, which can be useful to enable LPP-EUV sources suppliers to estimate collector lifetime and improve debris mitigation systems.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/276/1/012031Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 276
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 3. international Photonics and OptoElectronics Meetings
- Acronym
- POEM 2010
- Dates
- 2-5 Nov 2010
- Place
- Wuhan (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43044641
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; DEPOSITION; EXPANSION; EXTREME ULTRAVIOLET RADIATION; IONIZATION; LASER RADIATION; LASER-PRODUCED PLASMA; LIFETIME; MASS; MIRRORS; MOLYBDENUM; RUTHENIUM; SILICON; SPHERICAL CONFIGURATION; SPUTTERING; SUBSTRATES; THICKNESS; TIN IONS
- Descriptors DEC
- CHARGED PARTICLES; CONFIGURATION; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONS; METALS; PLASMA; PLATINUM METALS; RADIATIONS; REFRACTORY METALS; SEMIMETALS; SIMULATION; TRANSITION ELEMENTS; ULTRAVIOLET RADIATION