X-ray diffraction analysis of stan nite, wurtz-stan nite and pseudo-cubic quaternary compounds by Rietveld method
Creators
- 1. Universidad de Los Andes, Centro de Estudios de Semiconductores, 5101 Merida (Venezuela, Bolivarian Republic of)
- 2. Universidad de Los Andes, Centro de Estudios Avanzados en Optica, 5101 Merida (Venezuela, Bolivarian Republic of)
- 3. Universidad Industrial de Santander, Facultad de Ciencias, Escuela de Quimica, Grupo de Investigacion en Quimica Estructural, Apdo. Aereo 678, Bucaramanga (Colombia)
Description
Room temperature X-ray powder diffraction measurements were carried out on nine polycrystalline samples of the Cu2BIICIVX4 (B=Mn, or Fe, or Co; C=Si, or Ge, or Sn; X=S, or Se or Te) magnetic semiconductor compounds. The diffraction patterns were used to show the equilibrium conditions and to derive crystalline parameters values. The results showed that four of these compounds have a tetragonal stan nite structure with space group 142 m(No 121), two and orthorhombic wurtz-stan nite structure with space group Pmn21(No 31) and three of them and orthorhombic pseudo-cubic structure with space group F222 (No 22). In each case, the structure was refined using the Rietveld method. When the obtained atomic parameter values for the tetragonal compounds were plotted as a function of molecular weight W, it was found that the values of the atomic positions, the cation-anion bond distances, tetragonal distortion and internal distortion of the compounds containing S and /or Se lay on different lines. Also, it was found that when the experimental points of the cation-anion bond distances dCu-VI, dII-VI and dIV-VI were plotted against the effective lattice parameter ac = (V/N)1/3, a linear variation of these distances with ac was obtained. Values of the ionic energy gap Ci and homopolar energy gap Eh using the Phillips-Van Vechten scheme, with the present experimental crystallographic results as well as using the atomic data, were determined. It was found that the observed and predicted values of Ci and Eh lie on the same straight line. (Author)
Additional details
Publishing Information
- Journal Title
- Revista Mexicana de Fisica
- Journal Volume
- 60
- Journal Issue
- 2
- Journal Page Range
- p. 168-175
- ISSN
- 0035-001X
- CODEN
- RMXFAT
INIS
- Country of Publication
- Mexico
- Country of Input or Organization
- Mexico
- INIS RN
- 46134812
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANIONS; BOND LENGTHS; CATIONS; CRYSTAL STRUCTURE; DATA; ENERGY GAP; EQUILIBRIUM; LATTICE PARAMETERS; MAGNETIC SEMICONDUCTORS; MOLECULAR WEIGHT; ORTHORHOMBIC LATTICES; POLYCRYSTALS; QUATERNARY AMMONIUM COMPOUNDS; SPACE GROUPS; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION
- Descriptors DEC
- AMMONIUM COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; DIMENSIONS; INFORMATION; IONS; LENGTH; MATERIALS; SCATTERING; SEMICONDUCTOR MATERIALS; SYMMETRY GROUPS; TEMPERATURE RANGE; THREE-DIMENSIONAL LATTICES