Published January 31, 2010 | Version v1
Journal article

Evolution of the optical transitions in AlxGa1-xAs/GaAs quantum well structures grown on GaAs buffers with different surface treatments by molecular beam epitaxy

  • 1. Escuela Superior de Fisica y Matematicas, IPN, Edif. 9 UPALM, Mexico D. F. 07738 (Mexico)
  • 2. Departamento de Fisica, CINVESTAV, IPN, A. P. 14-740, Mexico D. F. 07300 (Mexico)
  • 3. Experimentalphysik I, Universitaet Bayreuth, Universitaetsstr. 30, D-95440 Bayreuth (Germany)

Description

Al0.3Ga0.7As/GaAs Quantum Well structures were grown by molecular beam epitaxy (MBE) on a 500 nm thick GaAs buffer layer subjected to the following surface processes: a) in-situ Cl2 etching at 70 oC and 200 oC, b) air-exposure for 30 min. The characteristics of these samples were compared to those of a continuously grown sample with no processing (control sample). We obtained the quantum wells energy transitions using photoreflectance spectroscopy as a function of the temperature (8-300 K), in the range of 1.2 to 2.1 eV. The sample etched at 200 oC shows a larger intensity of the quantum well peaks in comparison to the others samples. We studied the temperature dependence of the excitonic energies in the quantum wells (QWs) as well as in GaAs using three different models; the first one proposed by Varshni [4], the second one by Vina et al. [5], and the third one by Paessler and Oelgart [6]. The Paessler model presents the best fitting to the experimental data.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.09.041

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.09.041;
PII
S0040-6090(09)01488-6;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
7
Journal Page Range
p. 1825-1829
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
17. International Materials Research Congress symposium on photovoltaics, solar energy materials and thin films
Acronym
IMRC 2008
Dates
18-21 Aug 2008
Place
Cancun (Mexico)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.