Published April 8, 1994 | Version v1
Patent

X-ray source, realization of this one and application to diffractometers

Description

This patent concerns an X-ray source suitable especially for an analysis device of a sample by X-ray diffraction. The X-rays come from the iron 55 decay. 5 refs., 4 figs

Availability note (English)

Available from Institut National de la Propriete Industrielle, Paris (France).

Additional details

Additional titles

Original title (French)
Source de rayons X, procede de realisation de cette source et application a des diffractometres

Publishing Information

Imprint Pagination
11 p.
IPC:
Int. Cl. G01n23/20; G21G4/04; G01t7/00.
IPC
Int. Cl. G01n23/20; G21G4/04; G01t7/00.
Patent number
FR patent document 2696548/A/

Optional Information

Secondary number(s)
FR patent application 9212096.