Published 2000 | Version v1
Miscellaneous

Structural investigation of GaN powders thermally annealed at various temperatures

  • 1. Korea Univ., Seoul (Korea, Republic of)
  • 2. KAERI, Taejon (Korea, Republic of)

Description

Neutron diffraction(ND) has been utilized in this study to investigated the change of structural properties for GaN powders annealed in an NH3 atmosphere at temperatures of 850, 950, 1050 and 1150 .deg. C for 2 hours; GaN powders annealed at 1050 .deg. C in a N2 atmosphere for 2 hours were prepared, for comparison. Scanning electron microscopy(SEM), X-ray diffraction(XRD) and Raman scattering(RS) were performed additionally to help the interpretation of the spectra of the ND. The results of the ND experiments showed that the peaks in the ND spectra of the samples annealed in an NH3 atmosphere became stronger and narrower as annealing temperature increased. It was observed from the ND experiments that the nitrogen-deficient phases such as Ga2O3 and GaO2H were present in the sample annealed at 1050 .deg. C in a N2 atmosphere, but that such nitrogen-deficient phases were absent in the GaN powders annealed in an NH3 atmosphere. Our analysis of the ND data along with the SEM, XRD, and RS result revealed that the surface of the aggregates of the GaN powders annealed in a N2 atmosphere was of N-deficient phases such as Ga2O3 or GaO2H phases

Part of:
Proceedings of HANARO workshop 2000

Additional details

Publishing Information

Publisher
KAERI
Imprint Place
Taejon (Korea, Republic of)
Imprint Title
Proceedings of HANARO workshop 2000
Imprint Pagination
524 p.
Journal Page Range
p. 301-309

Conference

Title
HANARO workshop 2000
Dates
15 Dec 2000
Place
Taejon (Korea, Republic of)

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
34010115
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ANNEALING; GALLIUM NITRIDES; NEUTRON DIFFRACTION; PHYSICAL PROPERTIES; POWDERS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; GALLIUM COMPOUNDS; HEAT TREATMENTS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING

Optional Information

Notes
10 refs, 7 figs