Morphology and transmittance of porous alumina on glass substrate
- 1. Wuhan University of Technology. Wuhan (China)
- 2. Key Laboratory of Low Dimensional Materials and Application Technology, Xiangtan University, Ministry of Education, Xiangtan (China)
- 3. China Three Gorges University, Yichang (China)
Description
The porous optical film has higher threshold of laser-induced damage than densified films, for the study of mechanism of laser-induced damage of porous optical film with ordered pore structure. Porous anodic alumina (PAA) film with high transmittance on glass substrate has been prepared. Aluminum film was deposited on glass substrate by means of resistance and electron beam heat (EBH) evaporation. Porous alumina was prepared in oxalic acid solution under different anodizing conditions. At normal incidence, the optical transmittance spectrum over 300-1000 nm spectra region was obtained by spectrophotometer. SEM was introduced to analysis the morphology of the porous alumina film. The pore aperture increased with the increase of anodizing voltage, which resulted in a rapid decrease of the pore concentration and the optical thickness of porous alumina film. Damage morphology of porous alumina film is found to be typically defects initiated, and the defect is the pore presented on the film.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.11.007Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.11.007;
- PII
- S0169-4332(10)01530-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 257
- Journal Issue
- 8
- Journal Page Range
- p. 3307-3312
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44024855
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM OXIDES; ANODIZATION; APERTURES; CRYSTAL DEFECTS; DAMAGE; ELECTRON BEAMS; EVAPORATION; FILMS; GLASS; LASER RADIATION; OPTICAL PROPERTIES; OXALIC ACID; PORE STRUCTURE; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SPECTRA; SPECTROPHOTOMETERS; SUBSTRATES; THICKNESS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CARBOXYLIC ACIDS; CHALCOGENIDES; CHEMICAL COATING; CORROSION PROTECTION; CRYSTAL STRUCTURE; DEPOSITION; DICARBOXYLIC ACIDS; DIMENSIONS; ELECTROCHEMICAL COATING; ELECTROLYSIS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; LEPTON BEAMS; LYSIS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; OPENINGS; ORGANIC ACIDS; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; RADIATIONS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.