Published January 12, 2009 | Version v1
Journal article

Resistance switching in Fe-doped P0.7Ca0.3MnO3 thin films

  • 1. Center for Advanced Materials and Department of Physics, University of Houston, Houston, TX 77204 (United States)
  • 2. Department of Materials Science and Engineering, Nanjing University, Nanjing 210093 (China)

Description

An enhanced electric-pulse-induced resistance (EPIR) switching effect is observed in the Ag/P0.7Ca0.3Mn1-xFexO3/YBa2Cu3O7 (Ag/PCMFO/YBCO) and Ag/(PCMFO/PCMO)/YBCO structures. Unlike in the PCMO-based EPIR devices, where the Ag/PCMO interface plays a crucial role, both the Ag/PCMFO interface and the bulk PCMFO are found to have significant contributions to the EPIR switching of the PCMFO-based device. A possible explanation is to extend the pulse-driven oxygen ion/vacancy motion model at the metal/PCMO interface region to the bulk PCMFO

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2008.11.059

Additional details

Identifiers

DOI
10.1016/j.physleta.2008.11.059;
PII
S0375-9601(08)01687-3;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
373
Journal Issue
3
Journal Page Range
p. 376-378
ISSN
0375-9601
CODEN
PYLAAG

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.