Published November 27, 2006 | Version v1
Journal article

Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors

  • 1. Physics Department, California Institute of Technology, 1200 E. California Blvd., Pasadena, California 91125 (United States)
  • 2. Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, MS 169-506, Pasadena, California 91109-8099 (United States)

Description

The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. The authors present results on position sensitive x-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays

Additional details

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
89
Journal Issue
22
Journal Page Range
p. 222507-222507.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2006 American Institute of Physics