Published November 27, 2006
| Version v1
Journal article
Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors
Creators
- 1. Physics Department, California Institute of Technology, 1200 E. California Blvd., Pasadena, California 91125 (United States)
- 2. Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, MS 169-506, Pasadena, California 91109-8099 (United States)
Description
The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. The authors present results on position sensitive x-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays
Additional details
Identifiers
- DOI
- 10.1063/1.2390664;
- arXiv
- arXiv:cond-mat/0610130v1;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 89
- Journal Issue
- 22
- Journal Page Range
- p. 222507-222507.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38047147
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM; COOPER PAIRS; ELECTRONS; ENERGY RESOLUTION; EXCITATION; INDUCTANCE; MICROWAVE RADIATION; PHOTONS; RECOMBINATION; SPECTROPHOTOMETERS; SUPERCONDUCTORS; TANTALUM; THIN FILMS; X-RAY SPECTROMETERS
- Descriptors DEC
- BOSONS; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FERMIONS; FILMS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; METALS; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METALS; RESOLUTION; SPECTROMETERS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2006 American Institute of Physics