Published 1976
| Version v1
Book
Fluorescence yields for multiply ionized ions
Description
Theoretical concepts of fluorescence yields for a line, a multiplet and an electron configuration are presented. Calculational procedures are discussed. A critical examination of the previous analyses relevant to high-resolution x-ray spectral measurements is presented. It is suggested that one should compare directly the calculated x-ray relative intensities with the measurements. Such an analysis requires a model of multiple ionization and theoretical fluorescence yields. Theoretical x-ray spectra with different energy resolution are presented to illustrate the suggested procedure
Additional details
Publishing Information
- Publisher
- Institute of Electrical and Electronics Engineers, Inc.
- Imprint Place
- New York
- Imprint Title
- Proceedings of the fourth conference on the scientific and industrial applications of small accelerators
- Journal Page Range
- p. 149-156.
Conference
- Title
- 4. annual conference on the use of small accelerators.
- Dates
- 25 Oct 1976.
- Place
- Denton, TX, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 9380306
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRONIC STRUCTURE; ENERGY RESOLUTION; FLUORESCENCE; IONIZATION; MULTICHARGED IONS; MULTIPLETS; NEON; NITROGEN; X-RAY SPECTRA
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; IONS; LUMINESCENCE; NONMETALS; RARE GASES; RESOLUTION; SPECTRA
Optional Information
- Notes
- Imprint:See CONF-761059--.