Published December 2013 | Version v1
Journal article

Three-dimensional angle-resolved photoemission spectra of EuO thin film

  • 1. UVSOR Facility, Institute for Molecular Science, Okazaki 444-8585 (Japan)
  • 2. Center for Fostering Young and Innovative Researchers, Nagoya Institute of Technology, Nagoya 466-8555 (Japan)
  • 3. Graduate School of Engineering, Shinshu University, Nagano 380-8553 (Japan)
  • 4. Graduate School of Engineering, Nagoya University, Nagoya 464-8603 (Japan)
  • 5. School of Physical Sciences, The Graduate University for Advanced Studies (SOKENDAI), Okazaki 444-8585 (Japan)

Description

Highlights: •We report the electronic structure of EuO (0 0 1) films using synchrotron radiation angle-resolved photoemission spectroscopy. •We observed clear dispersions of the Eu 4f and O 2p states and these behaviors are consistent with the band calculation. •Despite of the thin film, the isotropic electronic structure was observed. •The itinerant Eu 4f state play an important role for the high ferromagnetic ordering temperature. -- Abstract: We report the electronic structure of EuO thin films not only parallel to but also perpendicular to the (0 0 1) plane using synchrotron radiation angle-resolved photoemission spectroscopy. As a result, the electronic structure perpendicular to the (0 0 1) plane is consistent with in-plane electronic structure in spite of the thin films. This result implies that the electronic structure of EuO thin films is consistent with that of the bulk materials

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2013.10.008

Additional details

Identifiers

DOI
10.1016/j.elspec.2013.10.008;
PII
S0368-2048(13)00170-9;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
191
Journal Page Range
p. 7-10
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.