Published 1993 | Version v1
Report Open

SOI Fully complementary BI-JFET-MOS technology for analog-digital applications with vertical BJT's

Description

A silicon-on-insulator, fully complementary, Bi-JFET-MOS technology has been developed for realizing multi-megarad hardened mixed analog-digital circuits. The six different active components plus resistors and capacitors have been successfully integrated in a 25-mask process using SIMOX substrate and 1 μm thick epitaxial layer. Different constraints such as device compatibility, complexity not higher than BiCMOS technology and breakdown voltages suitable for analog applications have been considered. Several process splits have been realized and all the characteristics presented here have been measured on the same split. P+ gate is used for PMOS transistor to get N and PMOST symmetrical characteristics. Both NPN and PNP vertical bipolar transistors with poly-emitters show fT > 5 GHz. 2-separated gate JFET's need no additional mask. (authors). 9 figs., 1 tab

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
3 p.
Report number
CEA-CONF--11617

Conference

Title
International Electron Devices Meeting.
Dates
5-8 Dec 1993.
Place
Washington, WA (United States).

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
25047821
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG SYSTEMS; DIGITAL CIRCUITS; HARDENING; MOSFET; SPECIFICATIONS
Descriptors DEC
ELECTRONIC CIRCUITS; FIELD EFFECT TRANSISTORS; MOS TRANSISTORS; SEMICONDUCTOR DEVICES; TRANSISTORS