Published 1988
| Version v1
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Investigation of a possibility of application of Ni/SiO2 adsorbent to long time diffusion purification of xenon- and methan mixture
Description
The possibility of application of Ni/SiO2 adsorbent for long duration purification of xenon in gas filled detectors was investigated. It is shown that diffusion purification of xenon and its mixtures by means of Ni/SiO2 allows to keep the level of electronegative impurities of approximately 10-15 ppm by O2 during a long time. The method of diffusion purification is simpler than the force purification, though for achievement of very low levels of electronegative impurity content the force method is preferable
Availability note (English)
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20019530.pdf
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Additional details
Additional titles
- Original title (Russian)
- Исследование возможности применения Ни/SiO
Publishing Information
- Imprint Pagination
- 6 p.
- Report number
- JINR--13-88-126
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 20019530
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ADSORBENTS; ENERGY RESOLUTION; GAS TRACK DETECTORS; GASEOUS DIFFUSION; IMPURITIES; MEDIUM PRESSURE; METHANE; NICKEL SILICATES; PROPORTIONAL COUNTERS; PURIFICATION; TIME DEPENDENCE; XENON
- Descriptors DEC
- ALKANES; DIFFUSION; ELEMENTS; HYDROCARBONS; MEASURING INSTRUMENTS; NICKEL COMPOUNDS; NONMETALS; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; RADIATION DETECTORS; RARE GASES; RESOLUTION; SILICATES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 2 refs.; 5 figs.; submitted to the journal Prib. Tekh. Ehksp.