Published June 2007
| Version v1
Journal article
Recent x-ray diffraction theory for the structural analysis of carbon material and the next-generation perspective
Description
The diffraction profile of carbon materials has been quantitatively analyzed by many researchers for more than fifty years and the structural parameters such as lattice constants, crystallite sizes, graphitizability and Debye-Waller factor have been proposed together with their estimation method. In the present article, the conventional method ever proposed are reviewed and the next-generation analytical theory of carbon structure will be overviewed. (author)
Additional details
Publishing Information
- Journal Title
- Tanso
- Journal Issue
- no.228
- Journal Page Range
- p. 185-194
- ISSN
- 0371-5345
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 39013103
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARBON; CRYSTAL STRUCTURE; DEBYE-WALLER FACTOR; FOURIER TRANSFORMATION; GRAPHITIZATION; LATTICE PARAMETERS; LEAST SQUARE FIT; PATTERSON METHOD; SIZE; X-RAY DIFFRACTION
- Descriptors DEC
- CALCULATION METHODS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; INTEGRAL TRANSFORMATIONS; MATHEMATICAL SOLUTIONS; MAXIMUM-LIKELIHOOD FIT; NONMETALS; NUMERICAL SOLUTION; SCATTERING; TRANSFORMATIONS
Optional Information
- Notes
- 26 refs., 17 figs.