Published November 26, 2007 | Version v1
Journal article Metadata-only

Material Analyses and Modification on the Tandetron Accelerator

Creators

  • 1. Department of Physics, Faculty of Science, J. E. Purkinje-University, Ceske mladeze 8, 400 96 Usti nad Labem (Czech Republic)
  • 2. Nuclear Physics Institute, Academy of Sciences of the Czech Republic, 250 68 Rez (Czech Republic)
  • 3. Department of Solid State Engineering, Institute of Chemical Technology, Technicka 5, 166 28 Prague (Czech Republic)
  • 4. Department of Physics, Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Brehova 7, 115 19 Praha 1 (Czech Republic)
  • 5. Kazan Physical-Technical Institute of RAS, Sibirski Trakt 10/7, 420029 Kazan, (Russian Federation)
  • 6. Department of Inorganic Chemistry, Institute of Chemical Technology, Technickd 5, 166 28 Prague (Czech Republic)

Description

The Tandetron 4130MC accelerator of the Nuclear Physics Institute offers new possibilities of analyses and modification of materials by ion beams. The RBS, ERDA-TOF, RBS-channeling and PIXE methods are briefly described. Examples of analyses of materials for photonics and spintronics are presented. Also the results of investigation of polymers modified by ion implantation, which may find application in medicine, are presented

Additional details

Identifiers

DOI
10.1063/1.2825833;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
958
Journal Issue
1
Journal Page Range
p. 56-59
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
4. International summer school on nuclear physics methods and accelerators in biology and medicine
Dates
8-19 Jul 2007
Place
Prague (Czech Republic)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39059432
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATORS; ION BEAMS; ION IMPLANTATION; IRRADIATION; MEDICINE; PHYSICAL RADIATION EFFECTS; PIXE ANALYSIS; POLYMERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATION EFFECTS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Notes
(c) 2007 American Institute of Physics