Published April 1, 2011
| Version v1
Journal article
Reduction of surface roughness and Neel coupling in perpendicular magnetic tunnel junctions with L10-FePt electrodes by plasma treatments
Creators
- 1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan (China)
- 2. Electronics and Optoelectronics Research Lab., Industrial Technology Research Institute, Hsinchu, 31040, Taiwan (China)
Description
The plasma treatment with O2/Ar mixture was applied to reduce the surface roughness of the L10-FePt electrode in perpendicular magnetic tunnel junctions. The surface roughness (Rrms) of the L10-FePt layer was decreased from 1.2 nm at the as-deposited state to 0.52 nm after the plasma treatment with the ratio of O2 to Ar equal to 0.5. The low surface roughness accompanying the formation of an oxide layer led to magnetic decoupling between free and reference layers after the plasma treatment on the surface of FePt layer. The existence of the oxide layer was confirmed by using transmission electron microscopy and x-ray photoelectron spectroscopy. The interfacial Pt-oxide layer plays a significant role in the magnetic decoupling.
Additional details
Identifiers
- DOI
- 10.1063/1.3561141;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 109
- Journal Issue
- 7
- Journal Page Range
- p. 07C724-07C724.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 55. annual conference on magnetism and magnetic materials
- Dates
- 14-18 Nov 2010
- Place
- Atlanta, GA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43037669
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COUPLING; DECOUPLING; ELECTRODES; IRON ALLOYS; LAYERS; MIXTURES; NEEL TEMPERATURE; OXIDES; PLASMA; PLATINUM ALLOYS; ROUGHNESS; SUPERCONDUCTING JUNCTIONS; SURFACES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL EFFECT; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; DISPERSIONS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; FILMS; MICROSCOPY; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PLATINUM METAL ALLOYS; SPECTROSCOPY; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS; TRANSITION TEMPERATURE
Optional Information
- Notes
- (c) 2011 American Institute of Physics