Published November 2015 | Version v1
Journal article Metadata-only

Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

Creators

  • 1. SCREEN Holdings Co., Ltd., Kyoto, 612-8486 (Japan)
  • 2. Institute of Laser Engineering, Osaka University, Suita, 565-0871 (Japan)

Description

A laser terahertz emission microscope (LTEM) can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g., electroluminescence (EL), photoluminescence (PL), and laser beam induced current (LBIC), as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL, and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell

Additional details

Identifiers

DOI
10.1063/1.4935913;

Publishing Information

Journal Title
AIP Advances
Journal Volume
5
Journal Issue
11
Journal Page Range
p. 117129-117129.8
ISSN
2158-3226
CODEN
AAIDBI

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47062319
Subject category
S14: SOLAR ENERGY;
Descriptors DEI
COMPARATIVE EVALUATIONS; DEPLETION LAYER; ELECTROLUMINESCENCE; LASER RADIATION; PERFORMANCE; PHOTOLUMINESCENCE; POLYCRYSTALS; SILICON SOLAR CELLS; THZ RANGE; WAVE FORMS
Descriptors DEC
CRYSTALS; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; EMISSION; EQUIPMENT; EVALUATION; FREQUENCY RANGE; LAYERS; LUMINESCENCE; PHOTOELECTRIC CELLS; PHOTON EMISSION; PHOTOVOLTAIC CELLS; RADIATIONS; SOLAR CELLS; SOLAR EQUIPMENT

Optional Information

Notes
(c) 2015 Author(s)