Published May 1, 2010
| Version v1
Journal article
Effect of Si3N4 nanoparticulates on the mechanical and electrical properties of PZT ceramics
- 1. Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand)
Description
PZT/xSi3N4 ceramics (when x=0, 0.1, 0.5 and 1 wt.%) were prepared by a solid-state mixed-oxide method and sintered at 1125 0C for 2 h. X-ray diffraction results suggested that the addition of Si3N4 nanoparticulates did not significantly affect the unit cell and tetragonality of PZT. The addition of 0.1 wt.% Si3N4 effectively increased the density and reduced the grain size of PZT ceramics. These changes played an important role in hardness and fracture toughness improvement. The maximum room temperature dielectric constant was achieved in a PZT/0.1 wt.% Si3N4 sample. Within the Si3N4-containing samples, the high-temperature dielectric values and ferroelectric properties seemed to increase with increasing concentrations of Si3N4.
Availability note (English)
Available from http://dx.doi.org/10.1088/0031-8949/2010/T139/014001Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 2010
- Journal Issue
- T139
- Journal Page Range
- [5 p.]
- ISSN
- 1402-4896
Conference
- Title
- 3. international symposium on functional materials 2009; AFM 2009: Preconference on advances in functional materials 2009
- Acronym
- ISFM 2009
- Dates
- 15-18 Jun 2009; 8-11 Jun 2009
- Place
- Jinju (Korea, Republic of); Jiu Zhai Gou (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42084249
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERAMICS; DENSITY; FERROELECTRIC MATERIALS; FRACTURE PROPERTIES; GRAIN SIZE; HARDNESS; NANOSTRUCTURES; PERMITTIVITY; PZT; SILICON NITRIDES; SOLIDS; TEMPERATURE RANGE 0273-0400 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; LEAD COMPOUNDS; MATERIALS; MECHANICAL PROPERTIES; MICROSTRUCTURE; NITRIDES; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; SILICON COMPOUNDS; SIZE; TEMPERATURE RANGE; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS