Published March 2012 | Version v1
Journal article Metadata-only

Validation of a crystal plasticity model using high energy diffraction microscopy

Creators

  • 1. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Champaign, IL (United States)
  • 2. NASA Langley, Hampton, VA (United States)
  • 3. ATK Small Caliber Systems, Independence, MO (United States)
  • 4. Advanced Photon Source, Argonne National Laboratory, Argonne, IL (United States)

Description

High energy diffraction microscopy is used to measure the crystallographic orientation and evolution of lattice strain in an Al–Li alloy. The relative spatial arrangement of the several pancake-shaped grains in a tensile sample is determined through in situ and ex situ techniques. A model for crystal plasticity with continuity of lattice spin is posed, where grains are represented by layers in a finite element mesh following the arrangement indicated by experiment. Comparison is drawn between experiment and simulation. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0965-0393/20/2/024006

Additional details

Identifiers

DOI
10.1088/0965-0393/20/2/024006;

Publishing Information

Journal Title
Modelling and Simulation in Materials Science and Engineering
Journal Volume
20
Journal Issue
2
Journal Page Range
[14 p.]
ISSN
0965-0393

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45006120
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; CRYSTALLOGRAPHY; CRYSTALS; DIFFRACTION; LAYERS; MICROSCOPY; PLASTICITY; SIMULATION; STRAINS
Descriptors DEC
COHERENT SCATTERING; MECHANICAL PROPERTIES; SCATTERING