Published 1999
| Version v1
Miscellaneous
Pressure dependence of the Cu-NQR relaxation times in the high-Tc material YBa2Cu4O8
- 1. National Research Inst. for Metals, Tsukuba, Ibaraki (Japan)
- 2. MST, Los Alamos National Laboratory, Los Alamos, NM (United States)
Description
The Cu-NQR relaxation times, T1 and T2G, have been measured under high pressures up to 2.5 kbar at a temperature of 300 K for the plane Cu sites in the superconductor YBa2Cu4O8. It is found that both the relaxation times become longer for higher pressure, indicating that antiferromagnetic spin fluctuations are decreased under pressure. The present result is consistent with the suggestion that a possible pressure dependence of the carrier density in the plane is the primary cause of the pressure dependence of Tc. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the 4th international symposium on advanced physical fields. Quantum phenomena in advanced materials at high magnetic fields
- Imprint Pagination
- 344 p.
- Journal Page Range
- p. 283-284
Conference
- Title
- 4. international symposium on advanced physical fields
- Acronym
- APF-4
- Dates
- 9-12 Mar 1999
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 31040576
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ANTIFERROMAGNETISM; BARIUM OXIDES; COPPER OXIDES; HIGH PRESSURE; HIGH-TC SUPERCONDUCTORS; NMR SPECTRA; NUCLEAR MAGNETIC RESONANCE; NUCLEAR QUADRUPOLE RESONANCE; PRESSURE DEPENDENCE; SUPERCONDUCTIVITY; YTTERBIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MAGNETIC RESONANCE; MAGNETISM; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; RESONANCE; SPECTRA; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS; YTTERBIUM COMPOUNDS
Optional Information
- Notes
- 8 refs., 1 fig.