Published January 1, 2018
| Version v1
Journal article
Exploring the limits of EDS microanalysis: rare earth element analyses
- 1. National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899 (United States)
- 2. U.S. Geological Survey, Denver, CO, 80225 (United States)
Description
It is a great time to be a microanalyst. After a few decades of incremental progress in energy-dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally useful but to identify the types of problems for which wavelength-dispersive X-ray spectrometry remains the better choice. The full extent of EDS's capabilities has surprised many. Low Z, low energy, and trace element detection have been demonstrated even in the presence of extreme peak interferences. In this paper, we will summarise the state-of-the-art and investigate a challenging problem domain, the analysis of minerals bearing multiple rare-earth elements. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/304/1/012013Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 304
- Journal Issue
- 1
- Journal Page Range
- [10 p.]
- ISSN
- 1757-899X
Conference
- Title
- 15. European Workshop on Modern Developments and Applications in Microbeam Analysis; IUMAS-7: 7. Meeting of the International Union of Microbeam Analysis Societies
- Acronym
- EMAS 2017
- Dates
- 7-11 May 2017
- Place
- Konstanz (Germany)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52074751
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; INTERFERENCE; TRACE AMOUNTS; WAVELENGTHS; X-RAY SPECTROSCOPY
- Descriptors DEC
- SPECTROSCOPY