Published January 1, 2018 | Version v1
Journal article

Exploring the limits of EDS microanalysis: rare earth element analyses

  • 1. National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899 (United States)
  • 2. U.S. Geological Survey, Denver, CO, 80225 (United States)

Description

It is a great time to be a microanalyst. After a few decades of incremental progress in energy-dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally useful but to identify the types of problems for which wavelength-dispersive X-ray spectrometry remains the better choice. The full extent of EDS's capabilities has surprised many. Low Z, low energy, and trace element detection have been demonstrated even in the presence of extreme peak interferences. In this paper, we will summarise the state-of-the-art and investigate a challenging problem domain, the analysis of minerals bearing multiple rare-earth elements. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/304/1/012013

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
304
Journal Issue
1
Journal Page Range
[10 p.]
ISSN
1757-899X

Conference

Title
15. European Workshop on Modern Developments and Applications in Microbeam Analysis; IUMAS-7: 7. Meeting of the International Union of Microbeam Analysis Societies
Acronym
EMAS 2017
Dates
7-11 May 2017
Place
Konstanz (Germany)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52074751
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; INTERFERENCE; TRACE AMOUNTS; WAVELENGTHS; X-RAY SPECTROSCOPY
Descriptors DEC
SPECTROSCOPY