Clustering and nearest neighbour distances in atom-probe tomography
Creators
- 1. Universite de Rouen, GPM, UMR CNRS 6634 BP 12, Avenue de l'Universite, 76801 Saint Etienne de Rouvray (France)
- 2. Institut National Polytechnique de Grenoble, SIMaP, UMR CNRS 5614, 1130 Rue de la Piscine, BP 75, 38 402 St. Martin d'Heres Cedex (France)
- 3. Institut Universitaire de France (France)
Description
The measurement of chemical composition of tiny clusters is a tricky problem in both atom-probe tomography experiments and atomic simulations. A new approach relying on the distribution of the first nearest neighbour (1NN) distances between solute atoms in the 3D space composed of A and B atoms was developed. This new approach, the 1NN method, is shown to be an elegant way to get the composition of tiny B-enriched clusters embedded in a random AB solid solution. The theoretical statistical distributions of first neighbour distances P(r) for both random solid solution and solute-enriched clusters finely dispersed in a depleted matrix are established. It is shown that the most probable distance of P(r) gives directly the phase composition. Applications of this model to both one-phase SiGe alloy and boron-doped silicon containing small clusters indicate that this new approach is quite reliable.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2009.06.007Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2009.06.007;
- PII
- S0304-3991(09)00134-X;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 109
- Journal Issue
- 10
- Journal Page Range
- p. 1304-1309
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44102371
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMS; BORON; CHEMICAL COMPOSITION; DISTANCE; DOPED MATERIALS; GERMANIUM SILICIDES; MATRIX MATERIALS; PROBES; SILICON; SOLID CLUSTERS; SOLID SOLUTIONS; SOLUTES; STATISTICS; TOMOGRAPHY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; DISPERSIONS; ELEMENTS; GERMANIUM COMPOUNDS; HOMOGENEOUS MIXTURES; MATERIALS; MATHEMATICS; MIXTURES; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; SOLUTIONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.