Published March 2008
| Version v1
Journal article
Kinematic electron diffraction study of crystallization kinetics of amorphous Yb1-xSmxAs4Te7 nanothick films
Creators
- 1. ANAS, Institute of Physics, Baku (Azerbaijan)
Description
The crystallization kinetics of ternary Yb1-xSmxAs4Te7 amorphous thin films has been investigated by kinematic electron diffraction method. It is shown that crystallization takes place in accordance with Avrami-Kolmogorov law. The kinetics parameters and the growth dimensionality of the crystallization have been determined
Additional details
Publishing Information
- Journal Title
- Fizika (Baku)
- Journal Volume
- 14
- Journal Issue
- 1
- Journal Page Range
- p. 3-4
- ISSN
- 1028-8546
INIS
- Country of Publication
- Azerbaijan
- Country of Input or Organization
- Azerbaijan
- INIS RN
- 47028556
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- AMORPHOUS STATE; CRYSTAL GROWTH; CRYSTALLIZATION; DATA ANALYSIS; ELECTRON DIFFRACTION; EVALUATED DATA; FILMS; KINETICS; NANOSTRUCTURES; PARTICLE KINEMATICS; SAMARIUM; TELLURIUM; YTTERBIUM
- Descriptors DEC
- COHERENT SCATTERING; DATA; DATA PROCESSING; DIFFRACTION; ELEMENTS; INFORMATION; METALS; NUMERICAL DATA; PHASE TRANSFORMATIONS; PROCESSING; RARE EARTHS; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 2 figs; 1 tab; 8 refs
- Collaborations
- Azerbaijan National Academy of Sciences, Institute of Physics, Department of Physical, Mathematical and Technical Sciences Baku (AZ)