Published March 2008 | Version v1
Journal article

Kinematic electron diffraction study of crystallization kinetics of amorphous Yb1-xSmxAs4Te7 nanothick films

Description

The crystallization kinetics of ternary Yb1-xSmxAs4Te7 amorphous thin films has been investigated by kinematic electron diffraction method. It is shown that crystallization takes place in accordance with Avrami-Kolmogorov law. The kinetics parameters and the growth dimensionality of the crystallization have been determined

Additional details

Publishing Information

Journal Title
Fizika (Baku)
Journal Volume
14
Journal Issue
1
Journal Page Range
p. 3-4
ISSN
1028-8546

INIS

Country of Publication
Azerbaijan
Country of Input or Organization
Azerbaijan
INIS RN
47028556
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
AMORPHOUS STATE; CRYSTAL GROWTH; CRYSTALLIZATION; DATA ANALYSIS; ELECTRON DIFFRACTION; EVALUATED DATA; FILMS; KINETICS; NANOSTRUCTURES; PARTICLE KINEMATICS; SAMARIUM; TELLURIUM; YTTERBIUM
Descriptors DEC
COHERENT SCATTERING; DATA; DATA PROCESSING; DIFFRACTION; ELEMENTS; INFORMATION; METALS; NUMERICAL DATA; PHASE TRANSFORMATIONS; PROCESSING; RARE EARTHS; SCATTERING; SEMIMETALS