Published 1975
| Version v1
Report
Open
Electronics of surface instrumentation
Creators
- 1. Bhabha Atomic Research Centre, Bombay (India). Technical Physics Div.
Description
An overview of the electronics involved in some of the analytical instruments for surface studies, viz. SIMS, ISS, AES, LEED, ESCA, FEM, FIM, APFIM and APS. has been projected. The need for the stringement technical specifications required for power supplies, amplifiers and other allied circuits, has been stressed. The functioning of the important circuits has been succintly described. (K.B.)
Files
8287746.pdf
Files
(363.0 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:2ca26f5eaf57377ab140a39dc4c07802
|
363.0 kB | Preview Download |
Additional details
Publishing Information
- Imprint Title
- Proceedings of the symposium on surface instrumentation
- Imprint Pagination
- p. 145-161.
- Report number
- BARC--798
Conference
- Title
- Symposium on surface instrumentation.
- Dates
- 7 May 1975.
- Place
- Bombay, India.
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 8287746
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; ELECTRON MULTIPLIER DETECTORS; ELECTRONIC EQUIPMENT; ION MICROPROBE ANALYSIS; ION MICROSCOPY; PERFORMANCE; POWER; POWER SUPPLIES; PULSE ANALYZERS; SPECIFICATIONS; SURFACE IONIZATION; SURFACE PROPERTIES
- Descriptors DEC
- CHEMICAL ANALYSIS; IONIZATION; MEASURING INSTRUMENTS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS
Optional Information
- Notes
- 10 refs., 11 figures.