Published July 20, 2015 | Version v1
Journal article

Thermal transport across few-layer boron nitride encased by silica

  • 1. Department of Mechanical Engineering, University of Minnesota, 111 Church Street SE, Minneapolis, Minnesota 55455 (United States)
  • 2. Department of Materials Science and Engineering, University of Texas at Arlington, 501 West First St., Arlington, Texas 76019 (United States)

Description

Two dimensional hexagonal boron nitride (h-BN) attracted attention for use in applications. Using equilibrium molecular dynamics, we examine the phonon transport in few-layer h-BN encased by silica (SiO2). We report large interfacial thermal resistances, of about 2.2 × 10−8 m2 K W−1, which are not sensitive to the number of h-BN layers or the SiO2 crystallinity. The h-BN/SiO2 superlattices exhibit ultra-low thermal conductivities across layers, as low as 0.3 W/m K. They are structurally stable up to 2000 K while retaining the low-thermal conductivity attributes. Our simulations indicate that incorporation of h-BN layers and nanoparticles in silica could establish thermal barriers and heat spreading paths, useful for high performance coatings and electronic device applications

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
107
Journal Issue
3
Journal Page Range
p. 031603-031603.4
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2015 AIP Publishing LLC