Molecular orientation and electronic structure at organic heterojunction interfaces
- 1. Department of Chemistry, National University of Singapore, 3 Science Drive 3, 117543 Singapore (Singapore)
- 2. Department of Physics, National University of Singapore, 2 Science Drive 3, 117542 Singapore (Singapore)
- 3. National University of Singapore (Suzhou) Research Institute, Suzhou (China)
Description
Highlights: • Molecular orientation at the organic heterojunction interfaces. • Energy level alignments at the organic heterojunction interfaces. • Gap-states mediated interfacial energy level alignment. - Abstract: Due to the highly anisotropic nature of π-conjugated molecules, the molecular orientation in organic thin films can significantly affect light absorption, charge transport, energy level alignment (ELA) and hence device performance. Synchrotron-based near-edge X-ray absorption fine structure (NEXAFS) spectroscopy represents a powerful technique for probing molecular orientation. The aim of this review paper is to provide a balanced assessment on the investigation of molecular orientation at the organic–organic heterojunction (OOH) interface by NEXAFS, as well as the gap-states mediated orientation dependent energy level alignment at OOH interfaces. We highlight recent progress in elucidating molecular orientation at OOH interfaces dominated by various interfacial interactions, gap-states controlled orientation dependent energy level alignments at OOH interfaces, and the manipulations of molecular orientation and ELA in OOH.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2015.02.014Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2015.02.014;
- PII
- S0368-2048(15)00046-8;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 204
- Journal Issue
- Part A
- Journal Page Range
- p. 12-22
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48009286
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; ALIGNMENT; BALANCES; CHARGE TRANSPORT; ELECTRONIC STRUCTURE; ENERGY LEVELS; FINE STRUCTURE; HETEROJUNCTIONS; INTERFACES; ORIENTATION; THIN FILMS; X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; FILMS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATIONS; SEMICONDUCTOR JUNCTIONS; SORPTION; SPECTROSCOPY; WEIGHT INDICATORS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.