Published April 22, 2013
| Version v1
Journal article
High throughput data acquisition at the XAS and SUL-X beamline at ANKA
- 1. Karlsruhe Institute of Technology, Institute for Synchrotron Radiation (KIT-ISS), PO Box 3640, D-76021 Karlsruhe (Germany)
Description
The ANKA beamlines XAS and SUL were upgraded with a faster data acquisition and higher degree of automation, because of the increased number of in-situ measurements and higher demand on measurement on a number of different edges during one beamtime. We optimized the data acquisition by using the multi element semiconductor detector together with the XMAP-electronic (XIA LLC) in the mapping mode. By using the hardware-triggered mode with buffered read out the fluorescence detector data collection is done without no further delay.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/430/1/012022Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 430
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 15. international conference on X-ray absorption fine structure
- Acronym
- XAFS15
- Dates
- 22-28 Jul 2012
- Place
- Beijing (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44113786
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; AUTOMATION; BUFFERS; DATA ACQUISITION; FLUORESCENCE; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS; X-RAY SPECTROSCOPY
- Descriptors DEC
- EMISSION; LUMINESCENCE; MEASURING INSTRUMENTS; PHOTON EMISSION; RADIATION DETECTORS; SPECTROSCOPY