Published September 15, 2009 | Version v1
Journal article

Effect of the Si/Ce molar ratio on the textural properties of rare earth element cerium incorporated mesoporous molecular sieves obtained room temperature

  • 1. School of Chemistry and Chemical Engineering, Jiangsu University, Xuefu Road 301, Zhenjiang 212013 (China)
  • 2. School of Material Science and Engineering, Jiangsu University, Xuefu Road 301, Zhenjiang 212013 (China)

Description

Rare earth Ce-incorporated MCM-41 mesoporous molecular sieves (CeMCM-41) were synthesized via a direct and nonhydrothermal method at room temperature from sodium silicate and ammonium cerium (IV) nitrate as raw materials. Cetyltrimethyl ammonium bromide (CTAB) was used as a template. The resultant samples were characterized by means of powder X-ray diffraction (XRD), transmission electron microscope (TEM), Fourier transform infrared spectroscopy (FT-IR), diffuse reflectance ultraviolet-visible spectroscopy (UV-vis) and N2 physical adsorption, respectively. The effect of the Si/Ce molar ratio on the crystalline structure and textural properties of CeMCM-41 was also investigated. The experimental results show that ordered CeMCM-41 mesoporous molecular sieves were successfully synthesized at room temperature and the resultant mesoporous materials have specific surface areas in the range of 594-1369 m2/g and average pore sizes in the range of ca. 2.5-2.8 nm. It has been found that the structural properties are strongly related to the amounts of cerium incorporation. When the cerium content increased in the samples, the intensity of the peak (1 0 0) was gradually reduced, and the surface area and structural regularity were diminished.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2009.07.046

Additional details

Identifiers

DOI
10.1016/j.apsusc.2009.07.046;
PII
S0169-4332(09)01043-5;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
23
Journal Page Range
p. 9425-9429
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.