Published April 1, 2006
| Version v1
Journal article
First-principles study of strain effects on Mn in Si
Creators
- 1. Department of Applied Physics and Physico-Informatics, Keio University, 3-14-1, Hiyoshi, Kohoku-Ku, Yokohama 223-8522 (Japan)
- 2. NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa 243-0198 (Japan)
Description
The effects of strain on Mn impurities in Si were investigated by using first-principles calculations. It is shown that substitutional Mn is stabilized and that the magnetic moment is maintained when a tensile strain is given. This suggests that the tensile strain is effective for improving the crystallinity of epitaxial films. Under high Mn concentration conditions, the substitutional Mn complex can cause a structural change and decrease the lattice constant of the crystal. Thus, the formation of shrinked epitaxial films can cause a structural change related to the substitutional Mn complexes, which might make it impossible to obtain the ferromagnetic property
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.12.169;
- PII
- S0921-4526(05)01557-7;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 376-377
- Journal Page Range
- p. 672-676
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 23. international conference on defects in semiconductors
- Dates
- 24-29 Jul 2005
- Place
- Awaji Island (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37073217
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTALS; EPITAXY; FILMS; IMPURITIES; LATTICE PARAMETERS; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; MANGANESE; MANGANESE COMPLEXES; SILICON; STRAINS
- Descriptors DEC
- COMPLEXES; CRYSTAL GROWTH METHODS; ELEMENTS; MATERIALS; METALS; SEMICONDUCTOR MATERIALS; SEMIMETALS; TRANSITION ELEMENT COMPLEXES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.