Published April 1, 2006 | Version v1
Journal article

First-principles study of strain effects on Mn in Si

  • 1. Department of Applied Physics and Physico-Informatics, Keio University, 3-14-1, Hiyoshi, Kohoku-Ku, Yokohama 223-8522 (Japan)
  • 2. NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa 243-0198 (Japan)

Description

The effects of strain on Mn impurities in Si were investigated by using first-principles calculations. It is shown that substitutional Mn is stabilized and that the magnetic moment is maintained when a tensile strain is given. This suggests that the tensile strain is effective for improving the crystallinity of epitaxial films. Under high Mn concentration conditions, the substitutional Mn complex can cause a structural change and decrease the lattice constant of the crystal. Thus, the formation of shrinked epitaxial films can cause a structural change related to the substitutional Mn complexes, which might make it impossible to obtain the ferromagnetic property

Additional details

Identifiers

DOI
10.1016/j.physb.2005.12.169;
PII
S0921-4526(05)01557-7;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
376-377
Journal Page Range
p. 672-676
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
23. international conference on defects in semiconductors
Dates
24-29 Jul 2005
Place
Awaji Island (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37073217
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; EPITAXY; FILMS; IMPURITIES; LATTICE PARAMETERS; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; MANGANESE; MANGANESE COMPLEXES; SILICON; STRAINS
Descriptors DEC
COMPLEXES; CRYSTAL GROWTH METHODS; ELEMENTS; MATERIALS; METALS; SEMICONDUCTOR MATERIALS; SEMIMETALS; TRANSITION ELEMENT COMPLEXES; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.