Published September 11, 2013 | Version v1
Journal article

Sensitivity of blackbody effective emissivity to wavelength and temperature: By genetic algorithm

  • 1. National Metrology Institute of South Africa (NMISA), Private Bag X34, Lynnwood Ridge, Pretoria, 0040 (South Africa)

Description

A variable-temperature blackbody (VTBB) is used to calibrate an infrared radiation thermometer (pyrometer). The effective emissivity (εeff) of a VTBB is dependent on temperature and wavelength other than the geometry of the VTBB. In the calibration process the effective emissivity is often assumed to be constant within the wavelength and temperature range. There are practical situations where the sensitivity of the effective emissivity needs to be known and correction has to be applied. We present a method using a genetic algorithm to investigate the sensitivity of the effective emissivity to wavelength and temperature variation. Two matlab® programs are generated: the first to model the radiance temperature calculation and the second to connect the model to the genetic algorithm optimization toolbox. The effective emissivity parameter is taken as a chromosome and optimized at each wavelength and temperature point. The difference between the contact temperature (reading from a platinum resistance thermometer or liquid in glass thermometer) and radiance temperature (calculated from the εeff values) is used as an objective function where merit values are calculated and best fit εeff values selected. The best fit εeff values obtained as a solution show how sensitive they are to temperature and wavelength parameter variation. Uncertainty components that arise from wavelength and temperature variation are determined based on the sensitivity analysis. Numerical examples are considered for illustration

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1552
Journal Issue
1
Journal Page Range
p. 716-721
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international temperature symposium
Dates
19-23 Mar 2012
Place
Los Angeles, CA (United States)

Optional Information

Notes
(c) 2013 AIP Publishing LLC