Published May 2003 | Version v1
Journal article

Line ratios and wavelengths of helium-like argon n=2 satellite transitions and resonance lines

Description

The characteristic X-ray emission from helium-like argon was investigated as a mean to diagnose hot plasmas. We have measured the radiation from n=2-1 parent lines and from KLn dielectronic recombination satellites with high wavelength resolution as function of the excitation energy using the Berlin Electron Beam Ion Trap. Values of wavelength relative to the resonance and forbidden line are tabulated and compared with references. The line intensity observed over a wide range of excitation energies is weighted with a Maxwellian electron-energy distribution to analyze line ratios as function of plasma temperature. Line ratios (j+z)/w and k/w compare nicely with theoretical predictions and demonstrate their applicability as temperature diagnostic. The ratio z/(x+y) shows not to depend on the electron density

Additional details

Identifiers

PII
S0168583X02019730;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
205
Journal Issue
1-4
Journal Page Range
p. 255-259
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
11. international conference on the physics of highly charged ions
Dates
1-6 Sep 2002
Place
Caen (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34077457
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; COMPARATIVE EVALUATIONS; ELECTRON BEAMS; ELECTRON DENSITY; EXCITATION; FORBIDDEN TRANSITIONS; FORECASTING; HOT PLASMA; RECOMBINATION; RESOLUTION; RESONANCE; TRAPS; WAVELENGTHS; X-RAY EMISSION ANALYSIS
Descriptors DEC
BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ENERGY-LEVEL TRANSITIONS; EVALUATION; IONS; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; PLASMA

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.