Line ratios and wavelengths of helium-like argon n=2 satellite transitions and resonance lines
Creators
Description
The characteristic X-ray emission from helium-like argon was investigated as a mean to diagnose hot plasmas. We have measured the radiation from n=2-1 parent lines and from KLn dielectronic recombination satellites with high wavelength resolution as function of the excitation energy using the Berlin Electron Beam Ion Trap. Values of wavelength relative to the resonance and forbidden line are tabulated and compared with references. The line intensity observed over a wide range of excitation energies is weighted with a Maxwellian electron-energy distribution to analyze line ratios as function of plasma temperature. Line ratios (j+z)/w and k/w compare nicely with theoretical predictions and demonstrate their applicability as temperature diagnostic. The ratio z/(x+y) shows not to depend on the electron density
Additional details
Identifiers
- PII
- S0168583X02019730;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 255-259
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077457
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; COMPARATIVE EVALUATIONS; ELECTRON BEAMS; ELECTRON DENSITY; EXCITATION; FORBIDDEN TRANSITIONS; FORECASTING; HOT PLASMA; RECOMBINATION; RESOLUTION; RESONANCE; TRAPS; WAVELENGTHS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL ANALYSIS; ENERGY-LEVEL TRANSITIONS; EVALUATION; IONS; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; PARTICLE BEAMS; PLASMA
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.