Published 1973 | Version v1
Book Metadata-only

Effects of ion beam milling on surface topography

Creators

  • 1. Commonwealth Scientific Corp., Alexandria, VA

Description

no abstract available

Additional details

Additional titles

Augmented title (English)
Ni--W composites

Publishing Information

Publisher
Claitor's Publishing Div.
Imprint Place
Baton Rouge, LA
Imprint Title
Proceedings of the thirty-first annual meeting of the Electron Microscopy Society of America
Imprint Pagination
p. 84-85.

Conference

Title
31. EMSA meeting.
Dates
14 Aug 1973.
Place
New Orleans, Louisiana, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
6160231
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; COMPOSITE MATERIALS; ELECTRON MICROSCOPY; ION BEAMS; MILLING; NICKEL ALLOYS; SURFACE PROPERTIES; TUNGSTEN ALLOYS
Descriptors DEC
ALLOYS; BEAMS; CHARGED PARTICLES; IONS; MACHINING; MICROSCOPY

Optional Information

Notes
Imprint:See CONF-730816--.