High resolution scanning ion probes
Creators
- 1. Chicago Univ., IL (USA). Dept. of Physics
- 2. Chicago Univ., IL (USA). Enrico Fermi Inst.
Description
High resolution (< 100 A) ion probes are shown to be feasible using either hydrogen ions from field ionization or heavy ions from an electro-hydrodynamic ion source. Low energy (approx. 25 keV) hydrogen ions are compared with electrons for use in microscopy, and the two are shown to entail similar amounts of radiation damage for thin (approx. 1 μg/cm2) light targets. The use of heavy ion beams in microanalysis is discussed, and the limitations on the spatial resolution are shown ro be inherent in the method, rather than due to instrumental resolution. Recent investigations made with the University of Chicago scanning transmission ion microscope of the interaction of molecular ions (H2+) with thin foils of carbon and polyethylene are discussed. (orig.)
Additional details
Additional titles
- Subtitle (English)
- Applications to physics and biology
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 168
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 139-149
- ISSN
- 0029-554X
Conference
- Title
- 4. international conference on ion beam analysis.
- Dates
- 25 - 29 Jun 1979.
- Place
- Aarhus, Denmark.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 11532152
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CARBON; ENERGY LOSSES; EXPERIMENTAL DATA; FOILS; GRAPHS; ION BEAMS; ION MICROPROBE ANALYSIS; ION MICROSCOPY; ION PROBES; PHYSICAL RADIATION EFFECTS; POLYETHYLENES; SPATIAL RESOLUTION
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DATA; DATA FORMS; ELEMENTS; INFORMATION; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUMERICAL DATA; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYMERS; POLYOLEFINS; PROBES; RADIATION EFFECTS; RESOLUTION