Published April 15, 2008 | Version v1
Journal article

Error Analysis in a Device to Test Optical Systems by Using Ronchi Test and Phase Shifting

  • 1. Instituto Nacional de Astrofisica, Optica y Electronica, Luis Enrique Erro No. 1., 72000 Tonantzintla, Puebla (Mexico)

Description

In optical workshops, Ronchi test is used to determine the optical quality of any concave surface, while it is in the polishing process its quality is verified. The Ronchi test is one of the simplest and most effective methods used for evaluating and measuring aberrations. In this work, we describe a device to test converging mirrors and lenses either with small F/numbers or large F/numbers, using LED (Light-Emitting Diode) that has been adapted in the Ronchi testing as source of illumination. With LED used the radiation angle is bigger than common LED. It uses external power supplies to have well stability intensity to avoid error during the phase shift. The setup also has the advantage to receive automatic input and output data, this is possible because phase shifting interferometry and a square Ronchi ruling with a variable intensity LED were used. Error analysis of the different parameters involved in the test of Ronchi was made. For example, we analyze the error in the shifting of phase, the error introduced by the movement of the motor, misalignments of x-axis, y-axis and z-axis of the surface under test, error in the period of the grid used

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
992
Journal Issue
1
Journal Page Range
p. 858-863
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
RIAO: 6. Ibero-American conference on optics; OPTILAS: 9. Latin-American meeting on optics, lasers and applications
Acronym
RIAO/OPTILAS 2007
Dates
21-26 Oct 2007
Place
Campinas, Sao Paulo (Brazil)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40017737
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ERRORS; ILLUMINANCE; INTERFEROMETRY; LENSES; LIGHT EMITTING DIODES; MIRRORS; OPTICAL SYSTEMS; PHASE SHIFT; POLISHING; POWER SUPPLIES; STABILITY; SURFACES; TESTING
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SURFACE FINISHING

Optional Information

Notes
(c) 2008 American Institute of Physics