Error Analysis in a Device to Test Optical Systems by Using Ronchi Test and Phase Shifting
Creators
- 1. Instituto Nacional de Astrofisica, Optica y Electronica, Luis Enrique Erro No. 1., 72000 Tonantzintla, Puebla (Mexico)
Description
In optical workshops, Ronchi test is used to determine the optical quality of any concave surface, while it is in the polishing process its quality is verified. The Ronchi test is one of the simplest and most effective methods used for evaluating and measuring aberrations. In this work, we describe a device to test converging mirrors and lenses either with small F/numbers or large F/numbers, using LED (Light-Emitting Diode) that has been adapted in the Ronchi testing as source of illumination. With LED used the radiation angle is bigger than common LED. It uses external power supplies to have well stability intensity to avoid error during the phase shift. The setup also has the advantage to receive automatic input and output data, this is possible because phase shifting interferometry and a square Ronchi ruling with a variable intensity LED were used. Error analysis of the different parameters involved in the test of Ronchi was made. For example, we analyze the error in the shifting of phase, the error introduced by the movement of the motor, misalignments of x-axis, y-axis and z-axis of the surface under test, error in the period of the grid used
Additional details
Identifiers
- DOI
- 10.1063/1.2926984;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 992
- Journal Issue
- 1
- Journal Page Range
- p. 858-863
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- RIAO: 6. Ibero-American conference on optics; OPTILAS: 9. Latin-American meeting on optics, lasers and applications
- Acronym
- RIAO/OPTILAS 2007
- Dates
- 21-26 Oct 2007
- Place
- Campinas, Sao Paulo (Brazil)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40017737
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ERRORS; ILLUMINANCE; INTERFEROMETRY; LENSES; LIGHT EMITTING DIODES; MIRRORS; OPTICAL SYSTEMS; PHASE SHIFT; POLISHING; POWER SUPPLIES; STABILITY; SURFACES; TESTING
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SURFACE FINISHING
Optional Information
- Notes
- (c) 2008 American Institute of Physics