Published 2010
| Version v1
Miscellaneous
Open
Stresses within dislocation cell structures: size effects versus stochastic processes
Creators
- 1. National Institute of Standards and Technology (NIST), Maryland (United States)
- 2. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- 3. University of Southern California (United States)
- 4. Argonne National Laboratory (ANL), Illinois (United States)
Description
no abstract available
Files
48018615.pdf
Files
(70.5 kB)
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Additional details
Publishing Information
- Imprint Pagination
- 1 p.
- Report number
- INIS-BR--17037
Conference
- Title
- international federation for heat treatment and surface engineering; 1. TMS/ABM international materials congress 2010
- Acronym
- 65. ABM international congress; 18. IFHTSE congress
- Dates
- 26-30 Jul 2010
- Place
- Rio de Janeiro, RJ (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 48018615
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BEAMS; COPPER; CRYSTALS; DEFORMATION; DISLOCATIONS; SIZE; STOCHASTIC PROCESSES; STRAINS; STRESSES; X RADIATION
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; LINE DEFECTS; METALS; RADIATIONS; TRANSITION ELEMENTS