Published May 1, 2009 | Version v1
Journal article

Molecular dynamics simulations of the structure of latent tracks in quartz and amorphous SiO2

  • 1. Helsinki Institute of Physics and Department of Physics, P.O. Box 43, FI-00014, University of Helsinki (Finland)
  • 2. Department of Electronic Materials Engineering, Research School of Physical Sciences and Engineering, Australian National University, Canberra, ACT 0200 (Australia)

Description

Swift heavy ion irradiation (SHII) can leave a latent ion track around the ion path. Tracks in amorphous silicon dioxide (a-SiO2) and quartz are interesting due to applications in nanofabrication, for example. In recent experiments, a previously unresolved fine structure in latent ion tracks in a-SiO2 was found comprising a lower density core and a higher density shell. We model the formation of latent ion tracks in crystalline quartz and amorphous SiO2 using classical molecular dynamics (MD) to simulate the irradiation at the atomistic level, and compare the results to small angle X-ray scattering (SAXS) experiments on amorphous, 2 μm thick SiO2 layers. Electronic energy deposition of 197Au ions corresponding to experiments is used in the simulations, to allow direct comparison between simulations and existing experiments. We explain the formation of the experimentally observed cylindrical core-shell structure with the dynamic simulations, and compare the obtained track dimensions and threshold energies with the experiment.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.01.071

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.01.071;
PII
S0168-583X(09)00110-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
8-9
Journal Page Range
p. 1456-1459
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam modification of materials
Dates
31 Aug - 5 Sep 2008
Place
Dresden (Germany)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.