Nanocrystalline transition aluminas: Nanostructure and features of x-ray powder diffraction patterns of low-temperature Al2O3 polymorphs
Creators
- 1. Boreskov Institute of Catalysis, SBRAS, Prospekt Lavrentieva 5, Novosibirsk 630090 (Russian Federation)
Description
Low-temperature γ-, η-, and χ-Al2O3 polymorphs were studied by high resolution transmission electron microscopy and x-ray powder diffraction along with computer simulation of the diffraction patterns. Planar defects lying on the (111), (110), and (100) planes, which are the origin of the broadening of x-ray diffraction peaks in different forms of aluminium oxide, were revealed. In addition to providing strong experimental support for the imperfect character of the specimen structures, these results demonstrate the possibility of using nanosized crystalline domains with a spinel-type arrangement, which are regularly shaped and have a specified, developed face and bounding surfaces, for the description of the nanostructure of a whole variety of low-temperature Al2O3 derivatives. It was found that different ways of domain packing in the oxide particles with a subsequent formation of planar defects contribute to specific kinds of line-shape broadening observed in the x-ray diffraction patterns of these materials. The mechanism of the vacancy generation upon propagation of the shear-type defect in the (110) plane of the spinel structure, which changes the Al3O4 stoichiometry to Al2O3, is also discussed
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 77
- Journal Issue
- 2
- Journal Page Range
- p. 024112-024112.13
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39084250
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; COMPUTERIZED SIMULATION; CRYSTALS; DEFECTS; NANOSTRUCTURES; PARTICLES; SPINELS; STOICHIOMETRY; SURFACES; TEMPERATURE RANGE 0065-0273 K; TRANSMISSION ELECTRON MICROSCOPY; VACANCIES; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; SCATTERING; SIMULATION; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2008 The American Physical Society