Structural and electronic properties of CdTe:Cl from first-principles
- 1. Laboratory of Solid State Microstructures and School of Physics, Nanjing University, Nanjing 210093 (China)
- 2. Department of Physics, China University of Mining and Technology, Xuzhou 221116 (China)
Description
The structural and electronic properties of the dominant intrinsic defect of the Cd vacancy (VCd) and the Cl impurity in CdTe are studied using density functional theory. VCd is calculated to be a shallow double acceptor. Cl will substitute Te site (ClTe) and then act as a shallow donor in CdTe. Moreover, ClTe can bond with VCd, forming the defect complexes of ClTe–VCd. ClTe−VCd is a shallower acceptor than that of VCd. The defect complexes of (ClTe−VCd)−1 can improve the p-doping behavior of CdTe. - Highlights: • Formation energies of the defects in CdTe are calculated. • Charge densities with the defect states in the band gap are drawn. • Band structures and partial densities of states suggest the defect complex has a lower acceptor level. • The formation of the defect complexes can improve the p-doping behavior of CdTe
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2013.09.046Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2013.09.046;
- PII
- S0254-0584(13)00726-8;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 143
- Journal Issue
- 2
- Journal Page Range
- p. 637-641
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46001331
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM TELLURIDES; COMPLEXES; DENSITY FUNCTIONAL METHOD; ELECTRIC CONDUCTIVITY; SEMICONDUCTOR MATERIALS; VACANCIES
- Descriptors DEC
- CADMIUM COMPOUNDS; CALCULATION METHODS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; POINT DEFECTS; TELLURIDES; TELLURIUM COMPOUNDS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.