Published August 2021 | Version v1
Journal article

Relationship between dislocation structure characteristics at triple junction and grain orientation in high pure copper

  • 1. Mechanical Electrical Engineering School, Beijing Information Science and Technology University, Beijing 100192 (China)
  • 2. School of Materials Science and Engineering, Fujian University of Technology, Fuzhou 350118 (China)

Description

Highlights: • The dislocation structure at TJs of high pure copper is observed and analyzed by TEM. • The dislocation density at TJs increases with the deformation. • The dislocation density in soft grain is larger than that in hard one. • The dislocation is determined to be (1/2) perfect dislocation. The dislocation structure at triple junctions with small to medium deformation in the samples of high pure copper is observed and analyzed by TEM. The effects of deformation and grain orientation on the dislocation structure at triple junctions are characterized. The results show that the dislocation density increases with the deformation. The dislocation lines are introduced in the slightly cold rolled copper while the dislocation networks are formed as the deformation increases. The dislocation density in soft grain is larger than that in hard one at the same deformation. The dislocation is determined to be (1/2) 011 perfect dislocation.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchar.2021.111265

Additional details

Identifiers

DOI
10.1016/j.matchar.2021.111265;
PII
S1044580321003879;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
178
Journal Page Range
vp.
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54034087
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COPPER; DEFORMATION; DISLOCATIONS; GRAIN ORIENTATION; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELEMENTS; LINE DEFECTS; METALS; MICROSCOPY; MICROSTRUCTURE; ORIENTATION; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2021 Elsevier Inc. All rights reserved.