Published April 1, 2009 | Version v1
Journal article Metadata-only

X-ray spectroscopy characterization of Ar17+ produced by an ECRIS in the afterglow mode

Creators

  • 1. Institut des NanoSciences de Paris, CNRS UMR 75-88, Universite Pierre et Marie Curie, Paris 6, 75015 Paris (France)
  • 2. GANIL, bd Henri Becquerel, BP 55027, F-14076 Caen cedex 05 (France)
  • 3. CIMAP, 6 bd du Marechal Juin, F-14050 Caen cedex 04 (France)

Description

An electron-cyclotron-resonance ion source (ECRIS) operating in the afterglow mode allows to produce pulsed highly charged ion beams. We present a characterization of the first production of pulsed Ar17+ ions from an ECRIS using X-ray spectroscopy techniques. An ion current increase of a factor 3-4 compared to the continuous operating mode with a short rise time (< 100 μ s) and a full width at half maximum of 500 μ s has been obtained.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/163/1/012111

Additional details

Identifiers

DOI
10.1088/1742-6596/163/1/012111;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
163
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
14. international conference on the physics of highly charged ions
Acronym
HCI 2008
Dates
1-5 Sep 2008
Place
Tokyo (Japan)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41097799
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AFTERGLOW; ARGON IONS; ECR ION SOURCES; ION BEAMS; MULTICHARGED IONS; PULSE RISE TIME; X-RAY SPECTROSCOPY
Descriptors DEC
BEAMS; CHARGED PARTICLES; ION SOURCES; IONS; SPECTROSCOPY; TIMING PROPERTIES